Field dossier · from the corpus
Reliability (semiconductor)
0predicted collisions
Where this field is predicted to collide
No open collisions on this field in the current run.
Most cited work
How to Specify, Estimate, and Validate Higher-Order Constructs in PLS-SEM
Reporting animal research: Explanation and elaboration for the ARRIVE guidelines 2.0
Artificial intelligence for fault diagnosis of rotating machinery: A review
Charlson Comorbidity Index: A Critical Review of Clinimetric Properties
Developing and validating a service robot integration willingness scale
Resistive switching memories based on metal oxides: mechanisms, reliability and scaling
Recent work · 2024 onward
Frictional Properties of Two-Dimensional Materials: Data-Driven Machine Learning Predictive Modeling
MOFSimBench: evaluating universal machine learning interatomic potentials in metal-organic framework molecular modeling
Machine learning applications in metallic materials: Recent advances and future perspectives
Nanostructured Material Design via a Retrieval-Augmented Generation (RAG) Approach: Bridging Laboratory Practice and Scientific Literature
Fusion Deep Learning for Predicting Conductivity in Electron-Doped Organic Polymers
Materials discovery through interpretation: An application to proton-conducting oxides